Atom-based RF electric field metrology: from self-calibrated measurements to subwavelength and near-field imaging

Written By Jim Carey

Authors
Chris Holloway, MT Simmons, JA Gordon, C Cooke, Dave Anderson, G Raithel

Journal
IEEE Transactions of Electromagnetic Compatibility, Volume 59, Issue 2

Publisher
IEEE

Publication Date
1/10/2017

https://ieeexplore.ieee.org/document/7812705

Jim Carey
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Electric field metrology for SI tracability: Systematic measurement uncertinaties in electromagnetically induced transparency in atomic vapor
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Sub-wavelength imaging and field mapping via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms