Electric field metrology for SI tracability: Systematic measurement uncertinaties in electromagnetically induced transparency in atomic vapor

Written By Jim Carey

Authors
Chris Holloway, MT Simmons, JA Gordon, A Dienstfrey, Dave Anderson, G Raithel

Journal
Journal of Applied Physics, Volume 121, Issue 23

Publisher
Journal of Applied Physics

Publication Date
5/21/2017

https://pubs.aip.org/aip/jap/article/121/23/233106/143771/Electric-field-metrology-for-SI-traceability

Jim Carey
Previous

Paschen-Back effects and Rydberg-state diamagnetism in vapor-cell electromagnetically induced transparency
Next

Atom-based RF electric field metrology: from self-calibrated measurements to subwavelength and near-field imaging